{"id":206,"date":"2018-10-17T19:52:23","date_gmt":"2018-10-17T19:52:23","guid":{"rendered":"http:\/\/www.ee.uconn.edu\/anwar-research\/?page_id=206"},"modified":"2018-10-24T16:12:15","modified_gmt":"2018-10-24T16:12:15","slug":"thz-assisted-counterfeit-detection","status":"publish","type":"page","link":"https:\/\/www.ee.uconn.edu\/anwar-research\/thz-assisted-counterfeit-detection\/","title":{"rendered":"THz Assisted Counterfeit Detection"},"content":{"rendered":"<div id=\"pl-206\"  class=\"panel-layout\" ><div id=\"pg-206-0\"  class=\"panel-grid panel-no-style\" ><div id=\"pgc-206-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-206-0-0-0\" class=\"so-panel widget widget_nav_menu panel-first-child panel-last-child\" data-index=\"0\" ><h3 class=\"widget-title\">Research Topics<\/h3><div class=\"menu-research-menu-container\"><ul id=\"menu-research-menu\" class=\"menu\"><li id=\"menu-item-282\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-282\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/memristor\/\">Memristor<\/a><\/li>\n<li id=\"menu-item-291\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-291\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/zno\/\">ZnO<\/a><\/li>\n<li id=\"menu-item-283\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-283\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/thz\/\">THz<\/a><\/li>\n<li id=\"menu-item-284\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-284\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/quantum-cascade-laser\/\">Quantum Cascade Laser<\/a><\/li>\n<li id=\"menu-item-285\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-285\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/high-electron-mobility-transistors-hemts\/\">High Electron Mobility Transistors (HEMTs)<\/a><\/li>\n<li id=\"menu-item-286\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-286\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/heterojunction-bipolar-transistors-hbts\/\">Heterojunction Bipolar Transistors (HBTs)<\/a><\/li>\n<li id=\"menu-item-287\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-287\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/resonant-tunneling-devices\/\">Resonant Tunneling Devices<\/a><\/li>\n<li id=\"menu-item-288\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-288\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/transport-in-semiconductors\/\">Transport in Semiconductors<\/a><\/li>\n<li id=\"menu-item-289\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-289\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/noise-in-semiconductor-devices\/\">Noise in Semiconductor Devices<\/a><\/li>\n<li id=\"menu-item-290\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-290\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/thz-assisted-counterfeit-detection\/\">THz Assisted Counterfeit Detection<\/a><\/li>\n<li id=\"menu-item-292\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-292\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/engineered-nanostructures-for-authentication\/\">Engineered Nanostructures for Authentication<\/a><\/li>\n<li id=\"menu-item-305\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-305\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/solar-blind-detector\/\">Solar Blind Detector<\/a><\/li>\n<li id=\"menu-item-381\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-381\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/photonics\/\">Photonics<\/a><\/li>\n<li id=\"menu-item-382\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-382\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/si-related-devices\/\">Si &amp; Related Devices<\/a><\/li>\n<li id=\"menu-item-383\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-383\"><a href=\"https:\/\/www.ee.uconn.edu\/anwar-research\/fundamental-physics\/\">Fundamental Physics<\/a><\/li>\n<\/ul><\/div><\/div><\/div><div id=\"pgc-206-0-1\"  class=\"panel-grid-cell\" ><div id=\"panel-206-0-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"1\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><span style=\"font-size: 24pt\">THz Assisted Counterfeit Detection<\/span><\/p>\n<hr \/>\n<p>Detection of packaged counterfeit electronics using THz spectroscopy is introduced by the research group led by Dr. Anwar.\u00a0 The process does not require any \u201cgolden IC\u201d for authentication and the IC need not be powered up.<\/p>\n<p>The\u00a0 Back Referenced THz Imaging for Counterfeit Detection, takes\u00a0 Five spot measurements both on\u00a0 the front and back sides of the packaged IC. This results in the typical THz spectroscopy pattern showing reflections from the surface and from the package-IC interface.\u00a0 The extracted refractive indices of the\u00a0<img loading=\"lazy\" decoding=\"async\" class=\" wp-image-262 alignright\" src=\"http:\/\/www.ee.uconn.edu\/anwar-research\/wp-content\/uploads\/sites\/38\/2018\/10\/THz-Assited-Counterfeit-Detection-1.png\" alt=\"\" width=\"202\" height=\"107\" \/>front\u00a0 surface w.r.t. the back surface or the back-referenced refractive index, \u2206n, is extremely sensitive to any difference between the two surface in terms of (a) material properties \u2013 presence of any foreign material and (b) thicknesses of the front and back surfaces from the IC-interfaces.<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-263 alignleft\" src=\"http:\/\/www.ee.uconn.edu\/anwar-research\/wp-content\/uploads\/sites\/38\/2018\/10\/THz-Assited-Counterfeit-Detection-2.png\" alt=\"\" width=\"276\" height=\"145\" \/><\/p>\n<p>With the front and back surfaces going through the same package processing steps and with the\u00a0die\u00a0located equidistant\u00a0\u00a0\u00a0 from the surfaces should result in a vanishing \u2206n, something that we observe in the top trace allowing us to conclude that\u00a0\u00a0\u00a0 the inspected package is authentic.\u00a0 Similar measurement on a counterfeit IC package results in the red trace with non-zero \u2206n.<\/p>\n<p>The back-referenced refractive indices of the front surface provides a unique, fast and reliable mechanism for the identification of counterfeit ICs.\u00a0 Note, THz absorption characteristics do not contain any unique signatures allowing differentiation between authentic and counterfeit electronics.\u00a0 It is anticipated that a hand-held THz source programmed to extract \u2206n will allow a quick determination of counterfeit electronic parts.<\/p>\n<p>Additionally, the use of advanced imaging techniques have allowed us enhance the resolution of THz imaging providing a non-destructive means to investigate packaged ICs.<\/p>\n<p><span style=\"font-size: 18pt\"><strong>Publications:<\/strong><\/span><\/p>\n<ul>\n<li><a class=\"gsc_a_at\">Modeling of terahertz images based on x-ray images: a novel approach for verification of terahertz images and identification of objects with fine details beyond terahertz\u00a0\u2026<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Terahertz Physics, Devices, and Systems X: Advanced Applications in Industry\u00a0\u2026<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Developing terahertz imaging equation and enhancement of the resolution of terahertz images using deconvolution<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Terahertz Physics, Devices, and Systems X: Advanced Applications in Industry\u00a0\u2026<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Advanced terahertz techniques for quality control and counterfeit detection<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Terahertz Physics, Devices, and Systems X: Advanced Applications in Industry\u00a0\u2026<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Techniques: Novel Non-destructive Tests for Detection of Counterfeit Electronic Components<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Connect. Symp. Microelectron. Optoelectron<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">A novel mathematical approach for converting X-Ray images to terahertz images<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Connect. Symp. Microelectron. Optoelectron.<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Physics, Devices, and Systems X: Advanced Applications in Industry and Defense<\/a>\n<div class=\"gs_gray\">MF Anwar, TW Crowe, T Manzur<\/div>\n<div class=\"gs_gray\">Proc. of SPIE Vol 9856, 985601-1<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz characterization of electronic components and comparison of terahertz imaging with x-ray imaging techniques<\/a>\n<div class=\"gs_gray\">K Ahi, N Asadizanjani, S Shahbazmohamadi, M Tehranipoor, M Anwar<\/div>\n<div class=\"gs_gray\">Terahertz Physics, Devices, and Systems IX: Advanced Applications in\u00a0\u2026<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Authentication of electronic components by time domain THz Techniques<\/a>\n<div class=\"gs_gray\">K Ahi, N Asadizanjani, M Tehranipoor, AFM Anwar<\/div>\n<div class=\"gs_gray\">Connect. Symp. Microelectron. Optoelectron., Bridgeport, Connecticut, USA<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">THZ Techniques: A Promising Platform for Authentication of Electronic Components<\/a>\n<div class=\"gs_gray\">K Ahi, N Asadizanjani, S Shahbazmohamadi, M Tehranipoor, M Anwar<\/div>\n<div class=\"gs_gray\">CHASE Conf. Trust. Syst. Supply Chain Assur., Storrs, Connecticut, USA<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense<\/a>\n<div class=\"gs_gray\">MF Anwar, TW Crowe, T Manzur<\/div>\n<div class=\"gs_gray\">Proc. of SPIE Vol 9483, 948301-1<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">A novel approach for enhancement of the resolution of terahertz measurements for quality control and counterfeit detection<\/a>\n<div class=\"gs_gray\">K Ahi, M Anwar<\/div>\n<div class=\"gs_gray\">Diminishing Manufacturing Sources and Material Shortages (DMSMS)<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense<\/a>\n<div class=\"gs_gray\">M Anwar, TW Crowe, T Manzur<\/div>\n<div class=\"gs_gray\">Proc. of SPIE Vol 9102, 910201-1<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense<\/a>\n<div class=\"gs_gray\">MF Anwar, TW Crowe, T Manzur<\/div>\n<div class=\"gs_gray\">Proc. of SPIE Vol 8716, 871601-1<\/div>\n<\/li>\n<li><a class=\"gsc_a_at\">Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense<\/a>\n<div class=\"gs_gray\">AFM Anwar, NK Dhar, TW Crowe<\/div>\n<div class=\"gs_gray\">Proc. of SPIE Vol 8363, 836301-1<\/div>\n<\/li>\n<\/ul>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>THz Assisted Counterfeit Detection Detection of packaged counterfeit electronics using THz spectroscopy is introduced by the research group led by Dr. Anwar.\u00a0 The process does not require any \u201cgolden IC\u201d for authentication and the IC need not be powered up. The\u00a0 Back Referenced THz Imaging for Counterfeit Detection, takes\u00a0 Five spot measurements both on\u00a0 the [&hellip;]<\/p>\n","protected":false},"author":66,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"page-frontpage.php","meta":{"footnotes":""},"class_list":["post-206","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/pages\/206","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/users\/66"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/comments?post=206"}],"version-history":[{"count":6,"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/pages\/206\/revisions"}],"predecessor-version":[{"id":365,"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/pages\/206\/revisions\/365"}],"wp:attachment":[{"href":"https:\/\/www.ee.uconn.edu\/anwar-research\/wp-json\/wp\/v2\/media?parent=206"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}